Material characterization facilities in the department has been expanded by a recent acquisition of high resolution electron microscopes. New laboratory space was created on ground floor of the department (B- block) with ample space reserved for similar equipment for future expansion, more.

The facilities installed are JEOL 2100F FEG TEM and FEI Nova Nano 430 FEG SEM. The JEM-2100F is an ultra-high resolution TEM that is capable of imaging atomic level structure. The micrsocope is equipped with a STEM system and energy-dispersive X-ray spectrometer (EDS) as well as with high resolution CCD camera.

FEI Nova Nano is high resolution field-emission SEM, capable of imaging down to the nanometer level. Capabilities of the Microscope include low and very low kV characterization. The Microscope is eqquiped with a variety of detectors such as helix, vCD STEM . The Microscope is also equipped with EDS system and EBSD camera